Addressing the New Challenges of Silicon Test. Joe Sawicki Vice President and General Manager Design-to-Silicon Division

Transcription

1 Addressing the New Challenges of Silicon Test Joe Sawicki Vice President and General Manager Design-to-Silicon Division

2 Why We re Here Describe new silicon test challenges facing the industry Explain how Mentor is investing to meet these new challenges Share our vision of the Tessent platform Mentor s comprehensive test and yield analysis solution Announce the new Tessent YieldInsight product a unique and innovative approach for improving silicon yield and quality 2 Introduction

3 Agenda Critical IC test challenges facing the industry Mentor s silicon test strategy Investing in test technology How Mentor innovation reduces the cost of test New solution initiatives An integrated test platform for SoCs Silicon bring-up and yield analysis solutions New product introduction: Tessent YieldInsight Yield analysis challenges Diagnosis-driven yield analysis Statistical analysis with Tessent YieldInsight YieldInsight case study finding the cause of systematic yield loss The Tessent product line 3 Test Challenges

4 Test Cost Driver Exploding Test Data Volume stuck-at at-speed other Volume of Test Data and Test Time (relative) 120X 100X 80X 60X 40X New tests added to detect new defects at advanced nodes At-speed test added due to increased timing and SI sensitivity Traditional tests growing due to increasing gate count 20X 180nm 2M gates 150nm 5M gates 130nm 10M gates 90nm 20M gates 65nm 50M gates 45nm 100M gates More test patterns higher test costs higher production costs 4 Test Challenges

5 Need for Compression Continues to Grow Test Data Volume Compression Requirements 1200X 1000X 800X 600X 400X 200X 0X Source: ITRS 2007, Test and Test Equipment 5 Test Challenges

6 Test Cost and TTM Drivers Test Complexity is Overwhelming ATPG Tool CPU core Memory DSP core ASIC IP core ASIC Memory Logic BIST Tool Memory BIST Tool SERDES Test Tool I / 0 PLL IP core Memory Memory Memory ASIC Analog ASIC Memory Repair Tool PLL Test Tool Embedded Compression IP Boundary Scan Tool How do you manage all the IP, tools, interfaces and interactions? 6 Test Challenges

7 Yield Issues in Nanometer Technologies Random Systematic Parametric 7 Test Challenges

8 Evolution of Yield Loss Contributors Source: Conquering Process Variability (ISSM 2006), A. Strojwas, PDF Solutions, Inc. 8 Test Challenges

9 Analog/Mixed Signal Test Adhoc manual and custom techniques dominate Mixed-signal portion of test time increasing at faster rates than digital 9

10 System-in-Package (SiP) & 3D Integration Limited test access Complex throughsilicon via structures New defect types Off-chip memory Requires Low pin count test methods and standard interfaces Via continuity and delay testing New fault models Off-chip memory BIST Source: Test Challenges for 3D Integrated Circuits, H. Lee, K. Chakrabarty; IEEE Design and Test of Computers, Sept./Oct Test Challenges

11 Agenda Critical IC test challenges facing the industry Mentor s silicon test strategy Investing in test technology How Mentor innovation reduces the cost of test New solution initiatives An integrated test platform for SoCs Silicon bring-up and yield analysis solutions New product introduction: Tessent YieldInsight Yield analysis challenges Diagnosis-driven yield analysis Statistical analysis with Tessent YieldInsight YieldInsight case study finding the cause of systematic yield loss The Tessent product line 11 Strategy

12 May 2008 Mentor Investing in Silicon Test As part of the overall deal Mentor took over the NXP Hamburg DFT development team Mentor acquires access to Philips/NXP developed DFT technology August Strategy

13 LogicVision Acquisition Combining and Building on #1 Market Positions 16% 8% 23% Synopsys Mentor + LV Cadence Other 53% Overall DFT Market 13 Strategy

14 Agenda Critical IC test challenges facing the industry Mentor s silicon test strategy Investing in test technology How Mentor innovation reduces the cost of test New solution initiatives An integrated test platform for SoCs Silicon bring-up and yield analysis solutions New product introduction: Tessent YieldInsight Yield analysis challenges Diagnosis-driven yield analysis Statistical analysis with Tessent YieldInsight YieldInsight case study finding the cause of systematic yield loss The Tessent product line 14 Strategy

15 Industry Leading ATPG and Compression for High Quality Test TestKompress 100X compression of test data volume and time 15 Strategy

16 Automatic Test Equipment Capital Cost per IC Unit (Learning Curve) 1.00 ATE Capital Cost/IC Unit Shipped ($) IBM Invents SCAN Test (Keeps Secret for 5 years) 1983 Tester-per-pin Introduced (MegaTest) Tester-per-pin & SCAN Ramp 2000 Introduction of Compressed SCAN E E E E E+13 Cummulative IC Units Shipped Note: ATE Capital Cost Using 3year straight-line depreciation, Adjusted for Inflation Source: SIA, VLSI Research, Federal Reserve 16 Strategy

17 Agenda Critical IC test challenges facing the industry Mentor s silicon test strategy Investing in test technology How Mentor innovation reduces the cost of test New solution initiatives An integrated test platform for SoCs Silicon bring-up and yield analysis solutions New product introduction: Tessent YieldInsight Yield analysis challenges Diagnosis-driven yield analysis Statistical analysis with Tessent YieldInsight YieldInsight case study finding the cause of systematic yield loss The Tessent product line 17 Initiatives

18 Combining Best-in-Class Point Tools for a Comprehensive Test Solution ATPG Layout-Aware Diagnosis Yield Analysis Embedded Compression Logic BIST Memory BIST Mixed-Signal BIST Interactive Debug Tessent TM Comprehensive Silicon Test Solutions 18 Initiatives

19 Mentor s Silicon Test Solution Taking a Holistic View of the Design and Process Tessent CPU core Memory I / 0 PLL ATPG IP core DSP core ASIC Memory BIST SERDES Test PLL Test Memory Memory Memory Logic BIST IP core ASIC Boundary Scan ASIC ASIC Embedded Compression Memory Memory Repair Analog Interactive Test Debug Layout-Aware Diagnosis Diagnosis-Driven Yield Analysis 19 Initiatives

20 Integrated SoC Test Flow Single Flow for BIST and/or ATPG & Compression Tessent SoCScan RTL checking of DFT rules One step DFT IP generation and insertion at core or chip level Automatic generation of manufacturing test patterns Complete verification at both core and chip Functional RTL or gates Functional RTL or gates with test Physical Synthesis & Optimization Final Netlist with test Rule Checking Test Planning IP Generation & Assembly Verification Scan Insertion ATPG & Sign-Off Tessent TestKompress LogicBIST Memory BIST PLLTest SerdesTest BoundaryScan Tessent TestKompress FastScan MFG Test Patterns 20 Initiatives

21 Memory/Logic Built-in Self-Test Products Tessent MemoryBIST Fully embedded solutions with access through standard TAP or CPU interface Tessent LogicBIST Support for automated efusebased repair of embedded memory Complete RTL-based IP generation and insertion and verification flow Post manufacturing test update 21

22 Mixed-Signal/High-Speed IO Test Products Tessent PLLTest Faster test times and lower test cost Tessent SerdesTest Accurate picosecond measurements of all critical characteristics Complete RTL-based IP generation and insertion and verification flow 22

23 Silicon Learning Products Tessent SiliconInsight Accelerate silicon validation and test debug Interactive bench top or ATE environment Tessent Diagnosis Effectively classify and localize silicon defects Enables diagnosis-driven yield analysis Tessent YieldInsight Reduce cycle time to root cause Improve success rate of failure analysis Prioritize yield enhancement efforts 23 Initiatives

24 Agenda Critical IC test challenges facing the industry Mentor s silicon test strategy Investing in test technology How Mentor innovation reduces the cost of test New solution initiatives An integrated test platform for SoCs Silicon bring-up and yield analysis solutions New product introduction: Tessent YieldInsight Yield analysis challenges Diagnosis-driven yield analysis Statistical analysis with Tessent YieldInsight YieldInsight case study finding the cause of systematic yield loss The Tessent product line 24 YieldInsight

25 Yield Analysis Challenges Target yield ramp Hidden Yield Limiters Undesired yield ramp Excursion Resolution Time Yield Ramp Identify/isolate observable yield loss Accelerate yield ramp Accelerate excursion resolution Identify hidden yield limiters Increase mature yield Increase product quality 25 YieldInsight

26 Diagnosis-Driven Yield Analysis Tessent Diagnosis Detailed analysis of each failing die High resolution/accuracy Additional fault isolation tools for FA Database Tessent YieldInsight Statistical analysis of diagnosis data Indicate presence of systematic defects Visualization and drill-down down capability 26 YieldInsight

27 Tessent Diagnosis Layout-Aware Failure Diagnosis Bridging Defects > 85% 85% reduction in in possible suspects Open Defects > 70% 70% of of net net segments eliminated as as suspects 27 YieldInsight

28 Layout-Aware Diagnosis Silicon Example Logical Diagnosis Layout-Aware Diagnosis B3 M3 B2 B4 M2 B5 M1 B1 B6 B7 B1 B8 Suspect type: OPEN or DOM BRIDGE Possible Bridges: 99 Possible Open Segments: 14 Suspect area: 1,192μm2 Suspect types: 1 (OPEN) Possible Bridges: 0 Possible Open Segments: 1 Suspect area: 130μm2 28 YieldInsight

29 Layout-Aware Diagnosis Silicon Example Logical Diagnosis Layout-Aware Diagnosis B3 M3 B2 B4 M2 B5 M1 B1 B6 B7 FA result M3 open on net n10909 (990.82, ) B1 B8 Suspect type: OPEN or DOM BRIDGE Possible Bridges: 99 Possible Open Segments: 14 Suspect area: 1,192μm2 Suspect types: 1 (OPEN) Possible Bridges: 0 Possible Open Segments: 1 Suspect area: 130μm2 29 YieldInsight

30 Introducing Tessent YieldInsight Diagnosis-Driven Yield Analysis Statistical analysis of yield loss Automated identification of systematic issues Filtering, visualization and drill-down capabilities 30 YieldInsight

31 Tessent YieldInsight Case Study Finding Hidden Systematic Yield Loss 95 lots Layout-aware diagnosis results from ~1400 failing die Typical yield analysis does not show significant signature Failing die per lot 31 YieldInsight

32 Via Macro Pareto Number of failing die where defect segment includes specific via macros Example of zonal analysis 32 YieldInsight

33 Via Macro Pareto Number of failing die where defect segment includes specific via macros 33 YieldInsight

34 # Die / Lot Diagnosed to Contain Single Via5 Number of failing die where defect includes single Via5 Lot 34 YieldInsight

35 # Die / Lot Diagnosed to Contain Single Via5 Number of failing die where defect includes single Via5 4th 6th All failing die The lots with the most occurrences of identified systematic issue are not the lots with the most failing die Lot 35 YieldInsight

36 Suspect Net and Defect Bounding Box suspect OPEN segment 36 YieldInsight

37 Suspect Net and Defect Bounding Box double via suspect OPEN segment only possible single via (M6_M5H) double via 37 YieldInsight

38 Tessent YieldInsight Case Study Summary YieldInsight Dashboard Diagnosis-driven yield analysis correctly called out systematic yield limiting issue (defective via validated by customer) Customer took corrective action with a manufacturing process change to avoid future yield excursions 38 YieldInsight

39 Current flow Uncover Hidden Yield Limiters Collect fail data failures Diagnosis on all devices Fine phys. loc devices Construction analysis Identify systematic issues Proposed flow Collect fail data 1,000-2,000 Diagnosis on all devices Zonal analysis Identify devices Identify systematic issues Construction analysis (2-3) 39 YieldInsight

40 Current flow Uncover Hidden Yield Limiters Collect fail data failures Diagnosis on Fine physical Fine phys. localization loc. all devices devices Construction analysis Identify systematic issues Weeks Proposed flow Collect fail data 1,000-2,000 Days Diagnosis on all devices Reduce time to root cause from weeks to days Zonal analysis Identify devices Identify systematic issues Construction analysis (2-3) Eliminate costly physical localization Identify yield limiters that may otherwise have gone unnoticed 40 YieldInsight

41 Agenda Critical IC test challenges facing the industry Mentor s silicon test strategy Investing in test technology How Mentor innovation reduces the cost of test New solution initiatives An integrated test platform for SoCs Silicon bring-up and yield analysis solutions New product introduction: Tessent YieldInsight Yield analysis challenges Diagnosis-driven yield analysis Statistical analysis with Tessent YieldInsight YieldInsight case study finding the cause of systematic yield loss The Tessent product line 42 Tessent

42 The Tessent Product Line Digital Logic Test Tessent Tessent TestKompress TestKompress Tessent Tessent FastScan FastScan Tessent Tessent LogicBIST LogicBIST Tessent Tessent SoCScan SoCScan Tessent Tessent BoundaryScan BoundaryScan Embedded Memory Test Tessent Tessent MemoryBIST MemoryBIST including including efuse efuse repair repair & field field programming programming Analog/Mixed-Signal Tessent Tessent PLLTest PLLTest Tessent Tessent SerdesTest SerdesTest Silicon Learning Tessent Tessent Diagnosis Diagnosis Tessent Tessent SiliconInsight SiliconInsight Tessent Tessent YieldInsight YieldInsight A comprehensive solution to address the new challenges of silicon test and yield analysis 43 Tessent

43 Summary Mentor is investing to meet the new challenges of silicon testing Tessent provides the industry s most advanced and comprehensive test solution New Tessent YieldInsight product offers a unique and innovative approach for improving silicon yield and quality Tessent

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