Contributors M. H. Al Sharkawy Arab Academy for Science and Technology and Maritime Transport, College of Engineering and Technology, Alexandria, Egypt A. Alù University of Pennsylvania, Department of Electrical and Systems Engineering, 200 South 33rd St., Philadelphia, PA 19104, University of Texas at Austin, Department of Electrical and Computer Engineering, 1 University Station C0803, Austin,TX 78712, P. Baccarelli Electronic Engineering Department, SAPIENZA University of Rome via Eudossiana 18, 00184, Rome, Italy R. Bakker A. M. Barbosa Instituto de Telecomunicações, Instituto Superior Técnico, Av. Rovisco Pais 1, 1049-001 Lisboa, Portugal F. Bilotti University Roma Tre Department of Applied Electronics, Via della Vasca Navale, 84 00146 Rome, Italy A. Boltasseva J. Bonache Barcelona 08193 BELLATERRA (Barcelona), Spain A. Bossavit LGEP (CNRS, Univ. Paris Sud), 11 Rue Joliot-Curie, 91192 Gif-sur-Yvette, France 299
300 Contributors A. Z. Elsherbeni The Center of Applied Electromagnetic Systems Research (CASER), Department of Electrical Engineering, The University of Mississippi, University, MS 38677, N. Engheta University of Pennsylvania, Department of Electrical and Systems Engineering, 200 South 33rd St., Philadelphia, PA 19104, V. Fedotov Optoelectronics Research Centre, University of Southampton, SO17 1BJ, UK M. Gil Barcelona, 08193 BELLATERRA (Barcelona), Spain D. S. Goshi Honeywell International Inc., Torrance, CA, S. Guenneau Department of Mathematical Sciences, University of Liverpool Peach Street, Liverpool L69 3BX, UK M. Gustafsson G. W. Hanson Department of Electrical Engineering and Computer Science, University of Wisconsin-Milwaukee, Milwaukee, WI 53211, S. He Division of Electromagnetic Engineering, School of Electrical Engineering, Royal Institute of Technology, S-100 44 Stockholm, Sweden Centre for Optical & Electromagnetic Research, Zhejiang University, Hangzhou 310058, China B. H. Henin The Center of Applied Electromagnetic Systems Research (CASER), Department of Electrical Engineering, The University of Mississippi, University, MS 38677, S. Hrabar Faculty of Electrical Engineering and Computing, University of Zagreb, Unska 3, Zagreb, HR 10 000, Croatia
Contributors 301 X. Hu Division of Electromagnetic Engineering, School of Electrical Engineering, Royal Institute of Technology S-100 44 Stockholm, Sweden Centre for Optical & Electromagnetic Research, Zhejiang University, Hangzhou 310058, China T. Itoh Department of Electrical Engineering, University of California Los Angeles, 405 Hilgard Avenue, Los Angeles, CA 90095 C. Jeppesen H. Kettunen Department of Radio Science and Engineering, Helsinki University of Technology (TKK), P.O. Box 3000, FI-02015 TKK, Finland A. V. Kildishev A. Kristensen G. Kristensson A. Lai HRL Laboratories LLC, Malibu, CA, T. Lam The Boeing Company, M/C 3W-50, P.O. Box 3707, Seattle, Washington, C. Larsson N. Lassouaoui University Paris X, Pôle Scientifique et Technique de Ville d Avray, Groupe Electromagnétisme Appliqué, 50 rue de Sèvre 92410, Ville d Avray, France
302 Contributors Z. Liu O. Luukkonen Department of Radio Science and Engineering/SMARAD, TKK Helsinki University of Technology, P.O. Box 3000, FI-02015 TKK, Finland F. Martín Barcelona, 08193 BELLATERRA (Barcelona), Spain A. Nicolet Institut Fresnel Aix-Marseille Université, Domaine Universitaire de Saint- Jérôme, F13397 Marseille cedex 20, France R. B. Nielsen Y. Ould Agha Institut Fresnel Aix-Marseille Université, Domaine Universitaire de Saint-Jérôme, F13397 Marseille cedex 20, France H. H. Ouslimani University Paris X, Pôle Scientifique et Technique de Ville d Avray, Groupe Electromagnétisme Appliqué, 50 rue de Sèvre 92410, Ville d Avray, France C. R. Paiva Instituto de Telecomunicações, Instituto Superior Técnico, Av. Rovisco Pais 1, 1049-001 Lisboa, Portugal N. Papasimakis Optoelectronics Research Centre, University of Southampton, SO17 1BJ, UK C. Parazzoli The Boeing Company, M/C 3W-50, P.O. Box 3707, Seattle, Washington, S. Paulotto Electronic Engineering Department, SAPIENZA University of Rome via Eudossiana 18, 00184, Rome, Italy
Contributors 303 A. Priou University Paris X, Pôle Scientifique et Technique de Ville d Avray, Groupe Electromagnétisme Appliqué, 50 rue de Sèvre 92410,Ville d Avray, France S. Prosvirnin Institute of Radio Astronomy, Kharkov, 61002, Ukraine Y. Rahmat-Samii Department of Electrical Engineering, University of California at Los Angeles, Los Angeles, CA 90095, M. A. Ribeiro Instituto de Telecomunicações, and Department of Electrical and Computer Engineering, Instituto Superior Técnico, Av. Rovisco Pais 1, 1049-001 Lisboa, Portugal A. G. Schuchinsky Queen s University Belfast, ECIT, Belfast, BT3 9DT, UK V. M. Shalaev A. Sihvola Department of Radio Science and Engineering, Helsinki University of Technology, Box 3000, FI 02015 TKK, Finland C. R. Simovski Department of Radio Science and Engineering/SMARAD, TKK Helsinki University of Technology, P.O. Box 3000, FI-02015 TKK, Finland G. Sisó Barcelona, 08193 BELLATERRA (Barcelona), Spain C. Sohl M. Tanielian The Boeing Company, M/C 3W-50, P.O. Box 3707, Seattle, Washington,
304 Contributors A. L. Topa Instituto de Telecomunicações and Department of Electrical and Computer Engineering, Instituto Superior Técnico, Av. Rovisco Pais 1, 1049-001 Lisboa, Portugal S. A. Tretyakov Department of Radio Science and Engineering/SMARAD, TKK Helsinki University of Technology, P.O. Box 3000, FI-02015 TKK, Finland L. Vegni University Roma Tre, Department of Applied Electronics, Via della Vasca Navale, 84 00146 Rome, Italy A. Vinogradov Institute for Theoretical and Applied Electrodynamics, Russian Academy of Sciences, Ul. Izhorskaya, Moscow, 125412, Russia H. Wallén Department of Radio Science and Engineering, Helsinki University of Technology (TKK), P.O. Box 3000, FI-02015 TKK, Finland M. C. K. Wiltshire Imaging Sciences Department, Clinical Sciences Centre, Imperial College London, Hammersmith Hospital Campus, Ducane Road, London W12 0NN, UK A. B. Yakovlev Department of Electrical Engineering, University of Mississippi, University, MS 38677-1848, X. Yan Queen s University Belfast, ECIT, Belfast, BT3 9DT, UK F. Yang Department of Electrical Engineering, The University of Mississippi, University, MS 38677, H.-K. Yuan N. Zheludev Optoelectronics Research Centre, University of Southampton, SO17 1BJ, UK
Contributors 305 F. Zolla Institut Fresnel Aix-Marseille Université, Domaine Universitaire de Saint-Jérôme, F13397 Marseille cedex 20, France S. Zouhdi LGEP SUPELEC, 11 Rue Joliot-Curie, 91192 Gif-sur-Yvette, France